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Defect Tracking Systems in Global Software Development – a work practice study Gabriela Avram, Anne Sheehan and Daniel K. Sullivan Interaction Design Centre, Department of Computer Science & Information Systems, Univer

Source URL: www.idc.ul.ie

• IEEE standards
• Defect tracking
• Product testing
• Software configuration management
• Bug tracking system
• Software bug
• Software development
• Collaboration tool

To appear in Proc. of IEEE 3rd Intl. Conf. on Biometrics: Theory, Applications and Systems (BTAS 09), Washington DC, SeptemberBiometric Fusion: Does Modeling Correlation Really Matter? Karthik Nandakumar, Arun Ros

Source URL: biometrics.cse.msu.edu

IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. XXX, NO. XXX, XXX 201X 1 Memristor-Based Material Implication (IMPLY)

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942 IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 15, NO. 6, DECEMBER 2010 A Mobile Agent-Based Framework for Flexible Automation Systems

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To Appear in The IEEE 6th International Conference on Biometrics: Theory, Applications and Systems (BTAS), Sept. 29-Oct. 2, 2013, Washington DC, USA Automatic Multi-view Face Recognition via 3D Model Based Pose Regulariz

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Find it with GPS! Provided by TryEngineering - www.tryengineering.org Lesson Focus Lesson focuses on exploring how the development of global positioning systems has revolutionised both defense and consumer product engine

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IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 48, NO. 2, FEBRUARYAnalysis of 1=f Noise in Switched MOSFET Circuits Hui Tian and Abbas El Gamal, Fellow, IEEE

Source URL: isl.stanford.edu

• Noise
• CMOS
• Transistor
• MOSFET
• Phase noise
• Active pixel sensor
• Noise generator
• Field-effect transistor
• Flicker noise
• Threshold voltage
• JohnsonNyquist noise
• SPICE

786 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: EXPRESS BRIEFS, VOL. 62, NO. 8, AUGUST 2015 VTEAM: A General Model for Voltage-Controlled Memristors

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OctoberARCS 2012 Call for Papers The 2012 International Conference on Architecture of Computing Systems (ARCS) will take place on 28 February to 2 March in Munich. This year’s conference will focus on

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